公开(公告)号：US20220335288A1

公开(公告)日：2022-10-20

申请号：US17301865

申请日：2021-04-16

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Marta Egorova ,  Justin F. Zimmerman

IPC: G06N3/08 ,  G06N3/04 ,  G06T7/00

Abstract: Methods, systems, and apparatuses related to identifying defects in a manufactured product using image recognition are described. Non-imaging data may be converted into an image by encoding the data to a heatmap. The resulting heatmap may be analyzed by one or more artificial intelligence model using image analysis techniques to provide an inference. The inference may indicate a pattern and/or a classification of a pattern of the heatmap.