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公开(公告)号：US20250104792A1
公开(公告)日：2025-03-27
申请号：US18751936
申请日：2024-06-24
Applicant: MICRON TECHNOLOGY, INC.
Inventor： YASUSHI MATSUBARA , YOSHINORI FUJIWARA , TAKUYA TAMANO
Abstract: According to one or more embodiments of the disclosure, an apparatus comprises a memory device and a bias temperature instability (BTI) controller. The BTI controller generates and outputs a command and address signal for memory testing. The command and address signal causes the memory device in the idle state to operate for the testing.
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