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公开(公告)号:US20250005793A1
公开(公告)日:2025-01-02
申请号:US18754677
申请日:2024-06-26
Applicant: MITUTOYO CORPORATION
Inventor: Masaaki SHIMIZU , Kasumi KONDO
Abstract: A graduation-plate posture inspection method includes an image data acquiring step of acquiring image data on the graduation plate from the camera, a region calculating step of extracting a first contrast region and a second contrast region in the image data, and a contrast processing step of contrasting the first contrast region with the second contrast region based on brightness or color. The contrast processing step includes calculating a difference between pixel values or luminance values of adjacent pixels in each of the first contrast region and the second contrast region to contrast a magnitude of the difference in the first contrast region with a magnitude of the difference in the second contrast region. The relative posture between the camera and the graduation plate is inspected based on a contrast result in the contrast processing step.
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公开(公告)号:US20220180097A1
公开(公告)日:2022-06-09
申请号:US17522132
申请日:2021-11-09
Applicant: MITUTOYO CORPORATION
Inventor: Takanori ASAMIZU , Masaaki SHIMIZU
Abstract: A measurement system includes: measurement target information database that stores measurement point information, including measurement conditions and guidance information for each measurement point, associated with the type of the measurement target; a measuring instrument that performs measurements on the measurement target; an image capturing unit that captures an image of a subject; a display unit; a measurement target identification unit that identifies the type of the measurement target based on the image captured by the image capturing unit; a measurement target information obtaining unit for obtaining the measurement point information corresponding to the type of the measurement target identified by the measurement target identification unit from the measurement target information database; and a setting unit that displays the guidance information included in the measurement point information obtained by the measurement target information obtaining unit on the display unit and sets the measurement conditions on the measuring instrument.
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