MICROMETER
    1.
    发明申请

    公开(公告)号:US20150059196A1

    公开(公告)日:2015-03-05

    申请号:US14473444

    申请日:2014-08-29

    CPC classification number: G01B3/18

    Abstract: A micrometer with good usability is provided. A micrometer has a frame with an anvil at one end and a spindle at another end, the spindle moving closer to or further away from the anvil. The frame is covered with a heat shield cover. The heat shield cover has a first anti-slip part. The first anti-slip part preferably has a plurality of protrusions.

    Abstract translation: 提供了具有良好可用性的千分尺。 千分尺具有在一端具有砧座的框架,另一端具有主轴,主轴移动靠近或远离砧座。 框架覆盖有隔热罩。 隔热罩具有第一防滑部分。 第一防滑部优选具有多个突起。

    MEASUREMENT APPARATUS AND BEARING
    2.
    发明申请

    公开(公告)号:US20200217363A1

    公开(公告)日:2020-07-09

    申请号:US16713346

    申请日:2019-12-13

    Abstract: The measurement apparatus includes an outer cylinder, a shaft body longitudinally movable on the inner surface side of the outer cylinder, a plurality of bearing balls disposed between an inner surface of the outer cylinder and an outer surface of the shaft body, and a measurement part that measures a relative position between the outer cylinder and the shaft body, and a first density of the bearing balls in a first area having a first length shorter than a total length of the outer cylinder in a longitudinal direction from one end of the outer cylinder is larger than a second density of the bearing balls in a second area having a second length shorter than the total length of the outer cylinder centered on a center position in the longitudinal direction of the outer cylinder.

    MICROMETER
    3.
    发明申请

    公开(公告)号:US20130276319A1

    公开(公告)日:2013-10-24

    申请号:US13837217

    申请日:2013-03-15

    Inventor: Shozaburo TSUJI

    CPC classification number: G01B3/18

    Abstract: A micrometer includes: a frame; an anvil; a spindle; an encoder; a display; a strain gauge that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge, as a compensation factor; and a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the strain gauge when a command for zeroset is given and a measurement-time deformation that is detected by the strain gauge in measurement, and based on the compensation factor stored in the storage.

    Abstract translation: 千分尺包括:一个框架; 铁砧 主轴; 编码器 一个显示器 检测框架变形的应变片; 作为补偿因子,存储检测值的变化量(由编码器检测到的主轴的位移),由应变仪检测出的单位变形量; 以及补偿器,其基于当给出用于零点的命令时由应变计检测到的零点时间变形与由测量中的应变计检测到的测量时间变形之间的差异来补偿检测值,并且基于 关于存储在存储器中的补偿因子。

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