公开(公告)号：US20210185211A1

公开(公告)日：2021-06-17

申请号：US17118037

申请日：2020-12-10

Applicant: MPI CORPORATION

Inventor： PING-YING WU ,  YUNG-CHIN LIU ,  HSUAN-CHIAO HUANG

IPC: H04N5/235 ,  G06T7/00

Abstract: A light emitting element detecting method and a light emitting element detecting equipment adapted for the method are discloses. The method includes the steps of generating a first control signal to open a shutter of an image capturing device which captures an image toward a light outlet of a light emitting element, generating a pulse signal to light up the light emitting element, generating a second control signal to close the shutter of the image capturing device and obtaining a detection image, and determining the light emitting status of the light outlet of the light emitting element according to the detection image. As a result, the present invention can accurately detect whether the light outlet of the light emitting element has the problem of emitting no light or flashing.

公开(公告)号：US20210183047A1

公开(公告)日：2021-06-17

申请号：US17117513

申请日：2020-12-10

Applicant: MPI CORPORATION

Inventor： PING-YING WU ,  YUNG-CHIN LIU

IPC: G06T7/00 ,  G06T3/00 ,  G01N21/95 ,  G01N21/88

Abstract: An image processing method includes the steps of lighting up at least a part of light emitting units of a light emitting device; capturing a plurality of detection images corresponding to a plurality of sections of the light emitting device respectively, wherein each section includes a plurality of lighted-up light emitting units, each detection image includes a plurality of light spots respectively corresponding to the light emitting units of the associated section, and every two adjacent sections have an overlap area including at least one lighted-up light emitting unit; and stitching the detection images of the adjacent sections together by taking the light spots corresponding to at least one lighted-up light emitting unit of the overlap area as alignment reference spots, so that the light emitting statuses of all the light emitting units are presented by a single image.

公开(公告)号：US20210181120A1

公开(公告)日：2021-06-17

申请号：US17117477

申请日：2020-12-10

Applicant: MPI CORPORATION

Inventor： PING-YING WU ,  CHIU-WANG CHEN ,  YUNG-CHIN LIU

IPC: G01N21/88

Abstract: An optical inspection system includes a brightness inspection module for inspecting the brightness of a light emitting element, an integrated inspection module for inspecting the near field optical characteristic and the beam quality factor of the light emitting element, and a far field inspection module for inspecting the far field optical characteristic of the light emitting element. As a result, the optical inspection system is space-saving and capable of reducing the distance and time of the movement of the device under test.