Photon transfer curve test time reduction
    1.
    发明申请
    Photon transfer curve test time reduction 有权
    光子转移曲线测试时间缩短

    公开(公告)号:US20080243419A1

    公开(公告)日:2008-10-02

    申请号:US11784075

    申请日:2007-04-05

    IPC分类号: G01R31/00

    CPC分类号: H04N17/002 H04N5/374

    摘要: An improved method for photon transfer curve (PTC) testing in an image sensor is described. A cost and time savings is achieved by reducing the number of frames necessary for measurements to two that are generated by illuminating a first plurality of pixel rows at a first intensity level m1, a second plurality of pixel rows at a second intensity level t2, and so forth up to an nth plurality of pixel rows illuminated at an nth intensity level mn where mn>m2>m1. The resulting image has “n” regions each with a different brightness. The highest intensity level essentially saturates the pixels in the nth region. In one example, a four row exposure and five intensity levels are employed in the illuminator sequence. An intelligent light source is pre-programmable with illumination intensity settings and is synchronized to the image sensor using HSYNC and VSYNC signals, for example.

    摘要翻译: 描述了一种用于图像传感器中的光子转移曲线(PTC)测试的改进方法。 通过将测量所需的帧数量减少为通过以第一强度水平m 1 1,第二多个像素行照亮第一多个像素行而产生的帧数量来实现成本和时间节省 在第二强度水平t 2 2 N等等,直到第n个强度水平m N n 照亮的第n个多个像素行,其中m N n >> m 2 m 1 。 所得到的图像具有各自具有不同亮度的“n”个区域。 最高强度水平基本上饱和第n个区域中的像素。 在一个示例中,在照明器序列中采用四行曝光和五个亮度级别。 智能光源可以用照明强度设置进行预编程,例如使用HSYNC和VSYNC信号与图像传感器同步。

    On chip test mode implementation
    2.
    发明申请
    On chip test mode implementation 有权
    片上测试模式实现

    公开(公告)号:US20080106602A1

    公开(公告)日:2008-05-08

    申请号:US11594292

    申请日:2006-11-08

    申请人: Mark Nussbacher

    发明人: Mark Nussbacher

    IPC分类号: H04N17/00

    CPC分类号: H04N5/3535 H04N17/002

    摘要: An improved on chip test method for determining the photon transfer curve (PTC) and dark current in an image sensor is described. Cost and time savings is achieved by reducing the number of frames necessary for the measurements to three including two exposure frames and one frame for dark current testing. A conventional test involving “n” different exposure times each with two frames is replaced by implementing a snap shot mode where a first plurality of pixel rows are exposed for a time t1, a second plurality of pixel rows are exposed for a time t2, and so forth up to an nth plurality of pixel rows exposed for a time tn where the total number of pixel rows equals a frame and tn>t2>t1. The resulting image has “n” regions each with a different brightness that become progressively brighter from top to bottom of the image.

    摘要翻译: 描述了用于确定图像传感器中的光子转移曲线(PTC)和暗电流的改进的片上测试方法。 通过将测量所需的帧数减少到三个,包括两个曝光帧,一个帧用于暗电流测试,可以节省成本和时间。 通过实施快照模式来代替涉及“n”个具有两个帧的不同曝光时间的常规测试,其中第一多个像素行暴露一段时间t 1,第二多个像素行 被曝光一段时间t 2 2,等等,直到第n个多个像素行暴露在时间t N n N,其中像素行的总数等于一个帧,并且 2 t <1> 。 所得到的图像具有各自具有不同亮度的“n”个区域,其从图像的顶部到底部逐渐变亮。