QUANTUM STATE TOMOGRAPHY WITH YES/NO MEASUREMENTS
    1.
    发明申请
    QUANTUM STATE TOMOGRAPHY WITH YES/NO MEASUREMENTS 有权
    量子状态与是/否测量的TOMOGRAPHY

    公开(公告)号:US20100094796A1

    公开(公告)日:2010-04-15

    申请号:US12371941

    申请日:2009-02-17

    申请人: Martin ROETTELER

    发明人: Martin ROETTELER

    IPC分类号: G06N7/02

    CPC分类号: G06N99/002 B82Y10/00

    摘要: Apparatus and methods are disclosed for performing quantum state tomography from the statistics of a collection of measurements, each of which has only two possible outcomes and has the feature of being a measurement of a single qubit. By carefully choosing the measurements it becomes possible to infer the state of a quantum system from the statistics. Moreover, the function which computes the state from the measurement statistics can be computed efficiently in the dimension of the underlying system. It is also possible to explicitly construct such yes/no measurements for all dimensions in which a (+1/−1 valued) Hadamard matrix exists.

    摘要翻译: 公开了用于根据测量集合的统计量执行量子态层析成像的装置和方法,每个测量集合仅具有两个可能的结果,并且具有作为单个量子位的测量的特征。 通过仔细选择测量,可以从统计学中推断量子系统的状态。 此外,可以在基础系统的维度中有效地计算从测量统计量计算状态的函数。 对于其中存在(+ 1 / -1值)Hadamard矩阵的所有维度,也可以明确地构造这样的“是/否”测量。