公开(公告)号：US20160011258A1

公开(公告)日：2016-01-14

申请号：US14330146

申请日：2014-07-14

Applicant: MediaTek Inc.

Inventor： Jen-Yi LIAO ,  Jen-Hang YANG

IPC: G01R31/3177

CPC classification number: G06F17/5072 ,  G01R31/318541 ,  G01R31/318583 ,  G06F2217/14

Abstract: A replacement method for scan cell of an integrated circuit (IC) is provided. A gate-level netlist of the IC is obtained. A place-and-route process is performed on the gate-level netlist to obtain a first netlist. A clock tree synthesis process is performed on the first netlist to obtain a second netlist. Static timing analysis is performed to analyze a plurality of first scan cells of the second netlist in normal mode and scan mode. The first scan cell is replaced with a second scan cell according to the static timing analysis that indicates the replaced first scan cell has a specific time margin in the scan mode. A first skew of the normal mode and a second skew of the scan mode are adjusted symmetrically in the first scan cell. The first skew and the second skew are adjusted asymmetrically in the second scan cell.

Abstract translation: 提供了集成电路（IC）的扫描单元的替代方法。 获得IC的门级网表。 在门级网表上执行布线处理以获得第一网表。 在第一网表上执行时钟树合成处理以获得第二网表。 执行静态时序分析以在正常模式和扫描模式下分析第二网表的多个第一扫描单元。 根据静态时序分析，用第二扫描单元替换第一个扫描单元，该静态时序分析指示被替换的第一扫描单元在扫描模式中具有特定的时间余量。 正常模式的第一偏移和扫描模式的第二偏移在第一扫描单元中对称地调整。 在第二扫描单元中第一偏斜和第二偏移被不对称地调整。