公开(公告)号：US08989318B2

公开(公告)日：2015-03-24

申请号：US13969624

申请日：2013-08-19

Applicant: Mediatek Inc.

Inventor： Kuan-Hua Chao ,  Tzu-Li Hung ,  Yu-Bang Nian

IPC: H03D1/00 ,  H04L27/06 ,  H04B1/16 ,  H03K5/19

CPC classification number: H04B1/16 ,  H03K5/19

Abstract: A detecting circuit includes: a first offset generating circuit, arranged to apply a first offset to an input signal pair and accordingly generate a first output signal pair; and a first sampling circuit, coupled to the first offset generating circuit, the first sampling circuit arranged to sample the first output signal pair to generate a first sampling signal, wherein the first sampling signal is utilized to identify a data signal on the input signal pair, and the first sampling circuit is controlled by a first signal that is irrelevant to the input signal pair.

Abstract translation: 一种检测电路包括：第一偏移生成电路，被布置为向输入信号对施加第一偏移并且因此产生第一输出信号对; 以及耦合到所述第一偏移生成电路的第一采样电路，所述第一采样电路经布置以对所述第一输出信号对进行采样以产生第一采样信号，其中所述第一采样信号用于识别所述输入信号对上的数据信号 并且第一采样电路由与输入信号对无关的第一信号控制。

公开(公告)号：US20130322577A1

公开(公告)日：2013-12-05

申请号：US13969624

申请日：2013-08-19

Applicant: MEDIATEK INC.

Inventor： Kuan-Hua Chao ,  Tzu-Li Hung ,  Yu-Bang Nian

IPC: H04B1/16

CPC classification number: H04B1/16 ,  H03K5/19

Abstract: A detecting circuit includes: a first offset generating circuit, arranged to apply a first offset to an input signal pair and accordingly generate a first output signal pair; and a first sampling circuit, coupled to the first offset generating circuit, the first sampling circuit arranged to sample the first output signal pair to generate a first sampling signal, wherein the first sampling signal is utilized to identify a data signal on the input signal pair, and the first sampling circuit is controlled by a first signal that is irrelevant to the input signal pair.

Abstract translation: 一种检测电路包括：第一偏移生成电路，被布置为向输入信号对施加第一偏移并且因此产生第一输出信号对; 以及耦合到所述第一偏移生成电路的第一采样电路，所述第一采样电路经布置以对所述第一输出信号对进行采样以产生第一采样信号，其中所述第一采样信号用于识别所述输入信号对上的数据信号 并且第一采样电路由与输入信号对无关的第一信号控制。