Pattern compensation techniques for charged particle lithographic masks
    1.
    发明授权
    Pattern compensation techniques for charged particle lithographic masks 失效
    带电粒子光刻掩模的图案补偿技术

    公开(公告)号:US07067220B2

    公开(公告)日:2006-06-27

    申请号:US10065963

    申请日:2002-12-04

    IPC分类号: G03F9/00

    CPC分类号: G03F1/20 Y10S430/143

    摘要: A method of producing a particle beam mask and mask structures to allow for the use of dummy fill shapes. This invention overcomes distortion in by adding a dummy shape in unexposed regions and applying a blocking layer to cover the dummy shape. The blocking layer is comprised of an aperture or additional mask mounted close to the mask or can be added to the mask itself.

    摘要翻译: 一种产生粒子束掩模和掩模结构以允许使用虚拟填充形状的方法。 本发明通过在未曝光区域中添加虚拟形状并施加阻挡层以覆盖虚拟形状来克服失真。 阻挡层由安装在掩模附近的孔或附加掩模组成,或者可以添加到掩模本身。

    Information storage on masks for microlithographic tools

    公开(公告)号:US06610446B2

    公开(公告)日:2003-08-26

    申请号:US09770732

    申请日:2001-01-26

    IPC分类号: G03F900

    CPC分类号: G03F7/70541 G03F1/20

    摘要: A mask includes an in-situ information storage mechanism on the mask, which stores mask pattern data that is supplied to a microlithographic tool (e.g., an optical stepper). The advantages of using the invention include immediate availability of pattern data of a particular mask to the microlithographic tool for improved integrated circuit productivity.