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公开(公告)号：US20200012313A1
公开(公告)日：2020-01-09
申请号：US16143841
申请日：2018-09-27
Applicant: Microchip Technology Incorporated
Inventor： Kevin Kilzer , Aditya Nukala
Abstract: A system for testing a clock monitor includes a fault injection circuit, a control circuit, and a clock monitor circuit to evaluate a clock source signal from a clock source. The fault injection circuit is to modify or replace the clock source signal from the clock source to yield a modified clock signal, and send the modified clock signal to the clock monitor circuit. The clock monitor circuit is to receive an input clock signal, determine whether the input clock signal indicates a faulty clock source, and issue a clock corrective action if the input clock signal indicates a faulty clock source. The control circuit is to monitor for the clock corrective action, and determine, based on whether the clock corrective action is issued, whether the clock monitor circuit is operating correctly.
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公开(公告)号：US10649487B2
公开(公告)日：2020-05-12
申请号：US16143841
申请日：2018-09-27
Applicant: Microchip Technology Incorporated
Inventor： Kevin Kilzer , Aditya Nukala
Abstract: A system for testing a clock monitor includes a fault injection circuit, a control circuit, and a clock monitor circuit to evaluate a clock source signal from a clock source. The fault injection circuit is to modify or replace the clock source signal from the clock source to yield a modified clock signal, and send the modified clock signal to the clock monitor circuit. The clock monitor circuit is to receive an input clock signal, determine whether the input clock signal indicates a faulty clock source, and issue a clock corrective action if the input clock signal indicates a faulty clock source. The control circuit is to monitor for the clock corrective action, and determine, based on whether the clock corrective action is issued, whether the clock monitor circuit is operating correctly.
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