DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS

    公开(公告)号:US20240021258A1

    公开(公告)日:2024-01-18

    申请号:US18373741

    申请日:2023-09-27

    Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including determining a value of a data state metric of a memory page, wherein the data state metric value is reflective of a number of bit errors associated with the memory page; upon determining that the data state metric value satisfies a first threshold criterion, obtaining, from a neural network, a value of a voltage distribution metric associated with the page; and upon determining that the voltage distribution metric value satisfies a second threshold criterion, performing a media management operation with respect to a block associated with the page, wherein the media management operation comprises writing data stored at the block to a new block.

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