公开(公告)号：US11017879B1

公开(公告)日：2021-05-25

申请号：US16723532

申请日：2019-12-20

Applicant: Micron Technology, Inc.

Inventor： James S. Rehmeyer ,  Christopher G. Wieduwilt ,  George Raad ,  Seth Eichmeyer ,  Dean Gans

IPC: G11C17/16 ,  G11C29/02 ,  G11C29/18 ,  G11C29/00

Abstract: Methods, systems, and devices for adjustable column address scramble using fuses are described. A testing device may detect a first error in a first column plane of a memory array and a second error in a second column plane of the memory array. The testing device may identify a first column address of the first column plane associated with the first error and a second column address of the second column plane based on detecting the first error and the second error. The testing device may determine, for the first column plane, a configuration for scrambling column addresses of the first column plane to different column addresses of the first column plane. In some cases, the testing device may perform a fuse blow of a fuse associated with the first column plane to implement the determined configuration.

公开(公告)号：US20210257043A1

公开(公告)日：2021-08-19

申请号：US17308448

申请日：2021-05-05

Applicant: Micron Technology, Inc.

Inventor： James S. Rehmeyer ,  Christopher G. Wieduwilt ,  George Raad ,  Seth Eichmeyer ,  Dean Gans

IPC: G11C29/00 ,  G11C17/16 ,  G11C29/02

Abstract: Methods, systems, and devices for adjustable column address scramble using fuses are described. A testing device may detect a first error in a first column plane of a memory array and a second error in a second column plane of the memory array. The testing device may identify a first column address of the first column plane associated with the first error and a second column address of the second column plane based on detecting the first error and the second error. The testing device may determine, for the first column plane, a configuration for scrambling column addresses of the first column plane to different column addresses of the first column plane. In some cases, the testing device may perform a fuse blow of a fuse associated with the first column plane to implement the determined configuration.

公开(公告)号：US11488685B2

公开(公告)日：2022-11-01

申请号：US17308448

申请日：2021-05-05

Applicant: Micron Technology, Inc.

Inventor： James S. Rehmeyer ,  Christopher G. Wieduwilt ,  George Raad ,  Seth Eichmeyer ,  Dean Gans

IPC: G11C29/00 ,  G11C17/16 ,  G11C29/02 ,  G11C29/18

Abstract: Methods, systems, and devices for adjustable column address scramble using fuses are described. A testing device may detect a first error in a first column plane of a memory array and a second error in a second column plane of the memory array. The testing device may identify a first column address of the first column plane associated with the first error and a second column address of the second column plane based on detecting the first error and the second error. The testing device may determine, for the first column plane, a configuration for scrambling column addresses of the first column plane to different column addresses of the first column plane. In some cases, the testing device may perform a fuse blow of a fuse associated with the first column plane to implement the determined configuration.