公开(公告)号：US20240427518A1

公开(公告)日：2024-12-26

申请号：US18680736

申请日：2024-05-31

Applicant: Micron Technology, Inc.

Inventor： Chia Wei Chang ,  Chia Yu Kuo ,  Tzu Ting Tseng ,  Pinhsueh Lai

IPC: G06F3/06

Abstract: An example apparatus can include a program component. The program component can program each of a plurality of planes during different time periods subsequent to performing a multi-plane programming on a non-volatile memory array. The program component can monitor a program pulse count for each of the respective plurality of planes per super block. The program component can, in response to the program pulse count for a respective block within one of the plurality of planes being above a threshold pulse count, determine that the respective block is a bad block.