公开(公告)号：US11515950B2

公开(公告)日：2022-11-29

申请号：US17464170

申请日：2021-09-01

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Martin Laabs ,  Dirk Plettemeier ,  Thomas Deckert ,  Johannes Dietmar Herbert Lange ,  Marc Vanden Bossche

IPC: H04B17/00 ,  H04B17/10 ,  H01Q21/06

Abstract: A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.

公开(公告)号：US20230160936A1

公开(公告)日：2023-05-25

申请号：US17532532

申请日：2021-11-22

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Martin Obermaier ,  Martin Laabs ,  Dirk Plettemeier ,  Marc Vanden Bossche ,  Thomas Deckert ,  Vincent Kotzsch ,  Johannes Dietmar Herbert Lange

IPC: G01R29/08

CPC classification number: G01R29/0871 ,  G01R29/0814

Abstract: A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.

公开(公告)号：US11982699B2

公开(公告)日：2024-05-14

申请号：US17532532

申请日：2021-11-22

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Martin Obermaier ,  Martin Laabs ,  Dirk Plettemeier ,  Marc Vanden Bossche ,  Thomas Deckert ,  Vincent Kotzsch ,  Johannes Dietmar Herbert Lange

IPC: H01Q21/06 ,  G01R29/08

CPC classification number: G01R29/0871 ,  G01R29/0814

Abstract: A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.

公开(公告)号：US20220077938A1

公开(公告)日：2022-03-10

申请号：US17464170

申请日：2021-09-01

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Martin Laabs ,  Dirk Plettemeier ,  Thomas Deckert ,  Johannes Dietmar Herbert Lange ,  Marc Vanden Bossche

IPC: H04B17/10

Abstract: A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.