Signal detection circuit and scanning probe microscope
    1.
    发明授权
    Signal detection circuit and scanning probe microscope 有权
    信号检测电路和扫描探针显微镜

    公开(公告)号:US09535088B2

    公开(公告)日:2017-01-03

    申请号:US14779622

    申请日:2014-03-04

    Abstract: A signal detection circuit includes: a VCO that generates a reference signal; a complex signal generation circuit that generates a complex signal from an input signal and the reference signal; a vector operation circuit that calculates an argument of the complex signal by performing a vector operation; and a subtracting phase comparator that compares the argument with a phase of the reference signal by calculating a difference between the argument and the phase of the reference signal, wherein the complex signal generation circuit includes: a multiplication circuit that multiplies the input signal by the reference signal; and an HPF that removes a DC component from a signal output from the multiplication circuit.

    Abstract translation: 信号检测电路包括:产生参考信号的VCO; 复信号发生电路,从输入信号和参考信号产生复信号; 矢量运算电路,通过执行矢量运算来计算复信号的自变量; 以及减法相位比较器,通过计算参考信号的参数和相位之间的差,将参数与参考信号的相位进行比较,其中复数信号产生电路包括:乘法电路,将输入信号乘以参考 信号; 以及从乘法电路输出的信号中去除直流分量的HPF。

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