公开(公告)号：US20180052726A1

公开(公告)日：2018-02-22

申请号：US15557865

申请日：2016-03-15

Applicant: NEC CORPORATION

Inventor： Shinichiro YOSHIDA ,  Kentarou YABUKI ,  Kiyoshi KATO ,  Hideo HASEGAWA ,  Hiroyuki MIYAZAKI

IPC: G06F11/07 ,  G05B23/02 ,  G06F17/30

Abstract: Accuracy of risks defined for abnormalities that might occur in a system is improved. The risk determination device 100 includes a classification unit 114 and a determination unit 115. The classification unit 114 classifies abnormal patterns 133, each representing a relationship among metrics at a time of abnormality detection in a system, into groups 134 based on a similarity between the abnormal patterns. The determination unit 115 determines, based on the number of abnormal patterns 133 classified into each of the groups 134, likelihood of an abnormality of the corresponding group 134.