公开(公告)号：US20200184622A1

公开(公告)日：2020-06-11

申请号：US16322616

申请日：2016-08-02

Applicant: NEC CORPORATION

Inventor： Subhajit CHAUDHURY ,  Gaku NAKANO

IPC: G06T7/00 ,  G06T7/246 ,  G06T7/11 ,  G06T7/174

Abstract: A degradation detection device (10) includes: an image acquisition unit (11) that acquires an image sequence of a detection target; a matching point specification unit (12) that specifies matching points in the image sequence; a motion amount calculation unit (13) that, based on the specified matching points, for each frame that constitutes the image sequence, specifies motion occurring between the frame and a frame immediately previous thereto, and calculates a motion amount for each of the matching points along a time series; and a degraded region candidate specification unit (14) that specifies a region in which degradation has likely occurred in the image sequence, based on the motion amounts of the matching points that were calculated along the time series.

公开(公告)号：US20200284576A1

公开(公告)日：2020-09-10

申请号：US16646423

申请日：2017-09-12

Applicant: NEC CORPORATION

Inventor： Subhajit CHAUDHURY ,  Hiroshi IMAI

IPC: G01B11/16 ,  G01B9/02 ,  G06T7/00 ,  G06T7/60

Abstract: A state determination apparatus 100 determines the state of a structure 200. The state determination apparatus 100 includes a measurement unit 10 configured to measure a deflection amount and a surface displacement amount in each of a plurality of target regions that are preset on the structure 200, a feature value calculation unit 20 configured to calculate, for the respective target regions, feature values each indicating a relationship between the deflection amount and the surface displacement amount, using the measured deflection amount and surface displacement amount, a spatial distribution calculation unit 30 configured to calculate a spatial distribution of the feature values using the feature values calculated for each of the target regions, and a degradation state determination unit 40 configured to determine a degradation state of the structure 200 based on the spatial distribution of the feature value.

公开(公告)号：US20190178814A1

公开(公告)日：2019-06-13

申请号：US16310847

申请日：2017-06-21

Applicant: NEC Corporation

Inventor： Gaku NAKANO ,  Subhajit CHAUDHURY

IPC: G01N21/954 ,  G01M99/00 ,  H04N5/232

Abstract: A state assessing device 100 includes: a parameter estimation unit 110 that estimates, using time-series images obtained by an image taking device taking images of a structure and a measured value of a distance from the image taking device to the structure, a motion parameter representing a relative motion of a surface of the structure with respect to the image taking device; and an abnormality determination unit 120 that determines an abnormality in the structure by using an estimation result of the motion parameter.