公开(公告)号：US20220358211A1

公开(公告)日：2022-11-10

申请号：US17620804

申请日：2019-06-25

Applicant: NEC Corporation

Inventor： Astha JADA ,  Toshiki KOBAYASHI ,  Takayuki SASAKI ,  Daniele Enrico ASONI ,  Adrian PERRIG

IPC: G06F21/54 ,  G06F21/53

Abstract: A semiconductor device (100) includes: a determination unit (110) configured to determine whether an avoidance condition of inspection of control flow integrity is satisfied (e.g., a degree of similarity with a previous input value is in a predetermined range) based on determination auxiliary information, which is at least an input value in a target code block to be executed among a plurality of code blocks in a predetermined program, and an inspection unit (120) configured to avoid inspection of control flow integrity in the target code block when it is determined that the avoidance condition is satisfied.

公开(公告)号：US20220245054A1

公开(公告)日：2022-08-04

申请号：US17618930

申请日：2019-06-25

Applicant: NEC Corporation

Inventor： Astha JADA ,  Toshiki KOBAYASHI ,  Takayuki SASAKI ,  Daniele Enrico ASONI ,  Adrian PERRIG

IPC: G06F11/36

Abstract: A semiconductor device (100) includes: first storage means (110) storing, in advance, a plurality of pieces of execution order inspection information (111˜11n) used for inspection of an execution order of a plurality of code blocks in a predetermined program, second storage means (120), which is a cache for the first storage means, and prediction means (130) for predicting a storage area of the execution order inspection information based on prediction auxiliary information in a first code block of the plurality of code blocks and a control flow graph of the program, the storage area being a prefetch target to be prefetched from the first storage means to the second storage means.