公开(公告)号：US20210075528A1

公开(公告)日：2021-03-11

申请号：US16771457

申请日：2017-12-11

Applicant: NEC Corporation

Inventor： Ichirou AKIMOTO ,  Daisuke YOKOI ,  Naoki SAWADA ,  Masayuki IKEDA

IPC: H04B17/391 ,  G06N20/20

Abstract: A first prediction unit 83 predicts the amount of future communication quality deterioration or the presence or absence of occurrence of future communication quality deterioration in a communication section between one communication device and another communication device communicably connected to the one communication device by using a first learning model generated on the basis of first attributes being attributes related to a cause of communication quality deterioration in the communication section. A second prediction unit 84 predicts the amount of future communication quality deterioration or the presence or absence of occurrence of future communication quality deterioration outside the communication section regarding one communication device by using a second learning model generated on the basis of second attributes being attributes related to a cause of communication quality deterioration outside the communication section regarding the one communication device.

公开(公告)号：US20210019653A1

公开(公告)日：2021-01-21

申请号：US16771472

申请日：2017-12-11

Applicant: NEC Corporation

Inventor： Ichirou AKIMOTO ,  Yousuke MOTOHASHI ,  Naoki SAWADA ,  Daisuke YOKOI ,  Masayuki IKEDA

IPC: G06N20/00 ,  G06K9/62 ,  G06F11/07 ,  G06N5/00

Abstract: A failure analysis device 10 is provided with an identification unit 11 that discriminates whether a predetermined failure has occurred on the basis of a learning model for discriminating the presence or absence of an occurrence of the predetermined failure learned by using a cause attribute which is associated with a cause of the predetermined failure and on the basis of a value of the attribute, and that identifies the cause of the predetermined failure discriminated to have occurred and countermeasures therefor.