公开(公告)号：US20240255408A1

公开(公告)日：2024-08-01

申请号：US18396937

申请日：2023-12-27

Applicant: NGK INSULATORS, LTD.

Inventor： Takakazu KOYAMA ,  Yuji WATANABE ,  Hiroyoshi INOUE ,  Takuya YAMADA

IPC: G01N15/08

CPC classification number: G01N15/08 ,  G01N2015/084

Abstract: An inspection device for a pillar shaped honeycomb filter, wherein the inspection device includes: a housing portion; an introduction pipe and a discharge pipe, each of the introduction pipe and the discharge pipe being connected to the housing portion; a particle generation portion for generating particles; a particle introduction portion for introducing the particles generated by the particle generation portion into the introduction pipe; a gas stirring portion disposed in the introduction pipe on an upstream side of the particle introduction portion; a particle concentration adjusting portion disposed in the introduction pipe on a downstream side of the particle introduction portion; and particle counters for measuring the number of particles, the particle counters being disposed in the introduction pipe and the discharge pipe on the downstream side of the particle introduction portion.

公开(公告)号：US20210302296A1

公开(公告)日：2021-09-30

申请号：US17184936

申请日：2021-02-25

Applicant: NGK INSULATORS, LTD.

Inventor： Yoshihiro SATO ,  Takakazu KOYAMA ,  Yuji WATANABE ,  Yutaka ISHII ,  Takaaki KANEMITSU ,  Makoto MURAI ,  Masanari IWADE ,  Takafumi TERAHAI ,  Ryota KURAHASHI ,  Akinari FUKAYA ,  Kenji EBISUTANI

IPC: G01N15/06 ,  G01N15/08 ,  G01N21/95

Abstract: An inspection method for a pillar-shaped honeycomb filter having a honeycomb-shaped first end face and a honeycomb-shaped second end face, including: allowing gas containing fine particles to flow into the first end face; imaging the entire second end face covered with the sheet-like light using a camera while the gas that has flowed into the first end face flows out of the second end face through the filter, and generating an image of the entire second end face covered with the sheet-like light; selecting an inspection area of the second end face and measuring information concerning a sum of luminance of each pixel in the inspection area; and determining quality of the filter based on at least the information concerning the concentration of the fine particles in the gas before the gas flows into the first end face and the information concerning the sum of luminance.