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公开(公告)号:US20230233080A1
公开(公告)日:2023-07-27
申请号:US18192078
申请日:2023-03-29
Applicant: NIDEK CO., LTD.
Inventor: Naoki TAKENO , Yasuhiro FURUUCHI , Shinya MITO , Kouji HAMAGUCHI
CPC classification number: A61B3/185 , A61B3/0025 , A61B3/0075
Abstract: An ophthalmic system for examining a subject eye of an examinee includes a plurality of examination units, a robot mechanism, and a controller. The plurality of examination units have housings different from each other, perform examinations different from each other, and include at least a first examination unit and a second examination unit. The robot mechanism has a holding unit that holds and releases either the first examination unit or the second examination unit, and a moving unit that is connected to the holding unit and moves three-dimensionally. A controller controls driving of the robot mechanism to adjust a relative positional relationship between the subject eye and the first examination unit or the second examination unit held by the holding unit. The first examination unit or the second examination unit is replaced to be held by the holding unit for performing a different examination on the subject eye.