专利检索 ap:("NUFLARE TECHNOLOGY, INC." OR "KABUSHIKI KAISHA TOSHIBA") AND inv:"Tomoki Umetsu" 第 1 页

1.

发明申请
Conductive Contact Point Pin and Charged Particle Beam Apparatus 审中-公开

公开(公告)号：US20180068824A1

公开(公告)日：2018-03-08

申请号：US15687886

申请日：2017-08-28

申请人： NUFLARE TECHNOLOGY, INC. , KABUSHIKI KAISHA TOSHIBA

发明人： Michihiro Kawaguchi , Kiminobu Akeno , Kenichi Kataoka , Tomoki Umetsu

IPC分类号： H01J37/02 , H01J37/317 , H01R4/66

CPC分类号： H01J37/026 , H01J37/3174 , H01R4/2406 , H01R4/66

摘要： A conductive contact point pin includes a pin body, and a plurality of convex portions formed in a tip portion of the pin body, wherein the conductive contact point pin breaks, by pressing a substrate where a film to be broken is formed on a conductive film from above the film to be broken, the film to be broken in order to be electrically connected to the conductive film.

2.

发明授权
Conductive contact point pin and charged particle beam apparatus 有权

公开(公告)号：US10373793B2

公开(公告)日：2019-08-06

申请号：US15687886

申请日：2017-08-28

申请人： NUFLARE TECHNOLOGY, INC. , KABUSHIKI KAISHA TOSHIBA

发明人： Michihiro Kawaguchi , Kiminobu Akeno , Kenichi Kataoka , Tomoki Umetsu

IPC分类号： H01R4/68 , H01J37/02 , H01J37/317 , H01R4/2406 , H01R4/66

摘要： A conductive contact point pin includes a pin body, and a plurality of convex portions formed in a tip portion of the pin body, wherein the conductive contact point pin breaks, by pressing a substrate where a film to be broken is formed on a conductive film from above the film to be broken, the film to be broken in order to be electrically connected to the conductive film.