Heterostructure interband tunneling diode
    1.
    发明授权
    Heterostructure interband tunneling diode 失效
    异质结带间隧道二极管

    公开(公告)号:US06204513B1

    公开(公告)日:2001-03-20

    申请号:US09304410

    申请日:1999-05-04

    IPC分类号: H01L2920

    CPC分类号: H01L29/88

    摘要: A heterostructure interband tunneling diode includes a contact layer comprising indium gallium arsenide of a first conductivity type, an injection layer comprising indium gallium arsenide of a second conductivity type, a first doped layer of the first conductivity type positioned adjacent to the contact layer, and a second doped layer of a second conductivity type juxtaposed between the first doped layer and the injection layer, wherein at least one of the first and second tunnel barrier layers comprises indium aluminium arsenide. A second embodiment includes a doped layer of the first conductivity type positioned adjacent to the contact layer, and a barrier layer positioned adjacent to the injection layer, and a quantum well layer comprising indium gallium arsenide juxtaposed between the doped layer and the barrier layer, wherein at least one of the doped and barrier layers comprises indium aluminium arsenide.

    摘要翻译: 异质结构带间隧道二极管包括包含第一导电类型的砷化铟镓的接触层,包括第二导电类型的砷化铟镓的注入层,与接触层相邻定位的第一导电类型的第一掺杂层,以及 第二导电类型的第二掺杂层并置在第一掺杂层和注入层之间,其中第一和第二隧道势垒层中的至少一个包括砷化铟铝。 第二实施例包括邻近接触层定位的第一导电类型的掺杂层和邻近注入层定位的阻挡层,以及包含掺杂层和阻挡层之间的砷化铟镓的量子阱层,其中 掺杂层和阻挡层中的至少一个包括砷化铟铝。