Support element office mode array repair code verification
    4.
    发明授权
    Support element office mode array repair code verification 失效
    支持元件办公模式阵列修复代码验证

    公开(公告)号:US08438431B2

    公开(公告)日:2013-05-07

    申请号:US12615296

    申请日:2009-11-10

    IPC分类号: G11C29/00 G06F11/00

    CPC分类号: G11C29/44 G11C29/24 G11C29/76

    摘要: A support element for verifying an array repair code solution includes a memory subsystem element including product data read from multichip modules utilized in a mainframe computing device, a wafer test repair algorithm, and a system test repair algorithm. The support element also includes a CPU emulator that causes the support element to perform an initial microcode load that includes a memory test, the memory test applying the wafer test repair algorithm to the product data to generate a wafer test repair solution and the system test repair algorithm to the product data to generate a system test repair solution and one or more repair rings for storing the wafer test repair solution and the system test repair solution.

    摘要翻译: 用于验证阵列修复代码解决方案的支持元件包括存储器子系统元件,其包括从在主机计算设备中使用的多芯片模块读取的产品数据,晶片测试修复算法和系统测试修复算法。 支持元件还包括CPU模拟器,其使得支持元件执行包括存储器测试的初始微代码负载,将晶片测试修复算法应用于产品数据的存储器测试以产生晶片测试修复解决方案和系统测试修复 算法对产品数据生成系统测试修复解决方案和一个或多个修复环,用于存储晶圆测试修复解决方案和系统测试修复解决方案。

    SUPPORT ELEMENT OFFICE MODE ARRAY REPAIR CODE VERIFICATION
    5.
    发明申请
    SUPPORT ELEMENT OFFICE MODE ARRAY REPAIR CODE VERIFICATION 失效
    支持元件办公模式阵列维修代码验证

    公开(公告)号:US20110113295A1

    公开(公告)日:2011-05-12

    申请号:US12615296

    申请日:2009-11-10

    IPC分类号: G11C29/08 G06F11/26

    CPC分类号: G11C29/44 G11C29/24 G11C29/76

    摘要: A support element for verifying an array repair code solution includes a memory subsystem element including product data read from multichip modules utilized in a mainframe computing device, a wafer test repair algorithm, and a system test repair algorithm. The support element also includes a CPU emulator that causes the support element to perform an initial microcode load that includes a memory test, the memory test applying the wafer test repair algorithm to the product data to generate a wafer test repair solution and the system test repair algorithm to the product data to generate a system test repair solution and one or more repair rings for storing the wafer test repair solution and the system test repair solution.

    摘要翻译: 用于验证阵列修复代码解决方案的支持元件包括存储器子系统元件,其包括从在主机计算设备中使用的多芯片模块读取的产品数据,晶片测试修复算法和系统测试修复算法。 支持元件还包括CPU模拟器,其使得支持元件执行包括存储器测试的初始微代码负载,将晶片测试修复算法应用于产品数据的存储器测试以产生晶片测试修复解决方案和系统测试修复 算法对产品数据生成系统测试修复解决方案和一个或多个修复环,用于存储晶圆测试修复解决方案和系统测试修复解决方案。