METHOD AND SYSTEM FOR EVALUATING STATISTICAL SENSITIVITY CREDIT IN PATH-BASED HYBRID MULTI-CORNER STATIC TIMING ANALYSIS
    2.
    发明申请
    METHOD AND SYSTEM FOR EVALUATING STATISTICAL SENSITIVITY CREDIT IN PATH-BASED HYBRID MULTI-CORNER STATIC TIMING ANALYSIS 失效
    基于路径的混合多角度静态时序分析评估统计灵敏度信息的方法和系统

    公开(公告)号:US20080209373A1

    公开(公告)日:2008-08-28

    申请号:US11679251

    申请日:2007-02-27

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5031

    摘要: Methods, systems and computer program products for analyzing a timing design of an integrated circuit are disclosed. According to an embodiment, a method for analyzing a timing design of an integrated circuit comprises: providing an initial static timing analysis of the integrated circuit; selecting a static timing test with respect to a static timing test point based on the initial static timing analysis; selecting a timing path leading to the static timing test point for the static timing test; determining an integrated slack path variability for the timing path based on a joint probability distribution of at least one statistically independent parameter; and analyzing the timing design based on the integrated slack path variability.

    摘要翻译: 公开了用于分析集成电路的定时设计的方法,系统和计算机程序产品。 根据实施例,用于分析集成电路的定时设计的方法包括:提供集成电路的初始静态时序分析; 基于初始静态时序分析,选择静态定时测试点的静态定时测试; 选择通过静态定时测试的静态定时测试点的定时路径; 基于至少一个统计学独立参数的联合概率分布来确定所述定时路径的综合松弛路径可变性; 并基于综合的松弛路径变异性分析时序设计。

    Device history based delay variation adjustment during static timing analysis
    10.
    发明授权
    Device history based delay variation adjustment during static timing analysis 有权
    静态时序分析期间基于设备历史的延迟变化调整

    公开(公告)号:US08108816B2

    公开(公告)日:2012-01-31

    申请号:US12484293

    申请日:2009-06-15

    IPC分类号: G06F17/50

    摘要: A system and method for the adjustment of history based delay variation during static timing analysis of an integrated circuit design. The method may include obtaining information through sources of variability of history based components of delay variability, and a relationship between the sources of variability and one or more bounded device histories. Then, inputting history bounds for at least one signal of the integrated circuit design, and computing and propagating history bounds through at least one first segment of the integrated circuit design to at least one signal of the integrated circuit design. Further, the method may include evaluating from at least one of the propagated history bounds, device history bounds for at least one second segment of the integrated circuit design, and based on the evaluated device history bounds, adjusting at least one of a value of the history based delay variability and propagation of timing.

    摘要翻译: 一种用于在集成电路设计的静态时序分析期间调整基于历史的延迟变化的系统和方法。 该方法可以包括通过延迟变异性的基于历史的组件的变异源获得信息,以及变异源与一个或多个有界设备历史之间的关系。 然后,为集成电路设计的至少一个信号输入历史界限,并且通过集成电路设计的至少一个第一段将集成电路设计的至少一个信号计算和传播历史界限。 此外,该方法可以包括从至少一个传播的历史界限评估集成电路设计的至少一个第二段的设备历史界限,以及基于所评估的设备历史界限,调整至少一个 基于历史的延迟变异性和时间传播。