METHOD OF SPECIMEN ANALYSIS AND SPECIMEN ANALYZER
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    发明申请
    METHOD OF SPECIMEN ANALYSIS AND SPECIMEN ANALYZER 有权
    样本分析方法和样本分析仪

    公开(公告)号:US20080070318A1

    公开(公告)日:2008-03-20

    申请号:US11864855

    申请日:2007-09-28

    IPC分类号: G01N21/75 G01N21/01

    摘要: A novel method of specimen analysis in which prior to specimen analysis, any interfering substance can be measured. There is provided a method of specimen analysis, comprising the steps of irradiating a specimen with light to thereby obtain an optical information on the specimen from the specimen; mixing the specimen with a reagent to thereby obtain an analytical sample; and irradiating the analytical sample with light to thereby obtain an optical information on the sample from the analytical sample and processing the optical information on the sample to thereby accomplish analysis of the analytical sample. In the step of the analysis of the analytical sample, analytical conditions commensurate with the analytical sample are set on the basis of the optical information on the specimen.

    摘要翻译: 样本分析的新方法,其中在样本分析之前,可以测量任何干扰物质。 提供了一种试样分析方法,包括以下步骤:用光照射样品,从而从样品获得样品的光学信息; 将样品与试剂混合,从而得到分析样品; 并用光照射分析用样品,从而得到来自分析样品的样品的光学信息,并处理样品上的光学信息,从而完成分析样品的分析。 在分析样品的分析步骤中,基于样品的光学信息设定与分析样品相符的分析条件。