Probe for measuring electrical characteristics

    公开(公告)号:USD1024815S1

    公开(公告)日:2024-04-30

    申请号:US29836243

    申请日:2022-04-26

    Designer: Masafumi Okuma

    Abstract: FIG. 1 is a perspective view of a probe for measuring electrical characteristics showing my new design;
    FIG. 2 is a front view thereof, the rear view being a mirror image thereof;
    FIG. 3 is a right side view thereof, the left side view being a mirror image thereof;
    FIG. 4 is a top view thereof;
    FIG. 5 is a bottom view thereof;
    FIG. 6 is a cross-sectional view thereof taken along line 6-6 in FIG. 2;
    FIG. 7 is an enlarged cross-sectional view thereof taken along line 7-7 in FIG. 2; and,
    FIG. 8 is an enlarged cross-sectional view thereof taken along line 8-8 in FIG. 2.
    The dashed broken lines illustrate portions of the probe for measuring electrical characteristics that form no part of the claimed design. The dot-dash broken lines define boundaries of the claimed design and form no part thereof.

Patent Agency Ranking