公开(公告)号：US20230113706A1

公开(公告)日：2023-04-13

申请号：US17495880

申请日：2021-10-07

Applicant: ORACLE INTERNATIONAL CORPORATION

Inventor： James ROHRKEMPER ,  Yifan WU ,  Guang C. WANG ,  Kenny C. GROSS

IPC: G01V3/10

Abstract: Embodiments for passive spychip detection through polarizability and advanced pattern recognition are described. For example a method includes inducing a magnetic field in a passive component of a target system while the target system is emitting EMI with changes in amplitude repeating at a time interval; generating a time series of measurements of a combined magnetic field strength of the induced magnetic field and the EMI; executing a frequency-domain to time-domain transformation on the time series of measurements to create time series signals of combined magnetic field strength over time at a specific frequency range; monitoring the time series signals with an ML model trained to predict correct signal values to determine whether predicted and measured values of the time series agree; and indicating that the target device may contain a passive spychip where anomalies are detected, and is free of passive spychips where no anomalies are detected.

公开(公告)号：US20240061139A1

公开(公告)日：2024-02-22

申请号：US18385116

申请日：2023-10-30

Applicant: ORACLE INTERNATIONAL CORPORATION

Inventor： James ROHRKEMPER ,  Yifan WU ,  Guang C. WANG ,  Kenny C. GROSS

IPC: G01V3/10

CPC classification number: G01V3/10

Abstract: Systems, methods, and other embodiments for passive component (e.g., spychip) detection through polarizability and advanced pattern recognition are described. In one embodiment a method includes applying an electromagnetic field to a target electronic system while the target electronic system is emitting a test pattern of electromagnetic interference. The method takes measurements of combined electromagnetic field strength emitted by the target electronic system while the electromagnetic field is being applied. The method detects the passive component based on dissimilarity between the measurements and estimates of electromagnetic field strength for the test pattern for a golden electronic system. The golden electronic system is of similar construction to the target electronic system and does not include the passive component. The method generates an electronic alert that the passive component is present in the target electronic system.