VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCOPE, AND VIBRATION COMPONENT MEASUREMENT METHOD

    公开(公告)号:US20230110754A1

    公开(公告)日:2023-04-13

    申请号:US17911572

    申请日:2021-03-25

    Abstract: In order to increase the order of a frequency of an AC signal to be applied between a vibration section and a sample to an order at substantially the same level as the order of a vibration frequency of the vibration section in measuring a vibration component of the vibration control section, a vibration component measuring device (2) includes: a vibration section (4); a first AC signal generator (20) configured to generate a first AC signal; a second AC signal generator (44) configured to generate a second AC signal having a frequency which is (a) more than one time and less than two times or (b) more than two times and less than three times as high as a frequency of the first AC signal; a signal applying section (14, 56) configured to apply the second AC signal between the vibration section and a sample (X); a vibration control section (10) configured to cause the vibration section to vibrate; and a measuring section (16, 18, 20, 22, 42, 44, 50) configured to measure a varying component of vibration of the vibration section, the varying component being varied by an interaction between the vibration section and the sample.

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