公开(公告)号：US10514297B2

公开(公告)日：2019-12-24

申请号：US15343220

申请日：2016-11-04

Applicant: OTO PHOTONICS INC.

Inventor： Meng-Wei Lee ,  Hsu Feng Cheng ,  Jan Liang Yeh

IPC: G01J3/02 ,  G01J3/28

Abstract: An electronic circuitry of a spectrometer, configured to electrically connect with an optical sensor of the spectrometer, includes a memory unit configured to store a measurement setting, a trigger line configured to transmit at least one trigger signal, and a control unit electrically connected to the trigger line and the memory unit. The control unit is configured to receive the trigger signal from the trigger line so as to instruct the spectrometer to perform a plurality of exposure measurements continuously under the measurement setting, and to save a plurality of spectral data acquired from the exposure measurements into the memory unit. A spectrometer using the electronic circuitry for performing the exposure measurements and a measuring method of the spectrometer are also provided.

公开(公告)号：US20170167920A1

公开(公告)日：2017-06-15

申请号：US15343220

申请日：2016-11-04

Applicant: OTO PHOTONICS INC.

Inventor： Meng-Wei Lee ,  Hsu Feng Cheng ,  Jan Liang Yeh

IPC: G01J3/28 ,  G01J3/02

CPC classification number: G01J3/027 ,  G01J3/0264 ,  G01J3/2803 ,  G01J2003/283 ,  G01J2003/2833 ,  G06T2207/10144 ,  G06T2207/20

Abstract: An electronic circuitry of a spectrometer, configured to electrically connect with an optical sensor of the spectrometer, includes a memory unit configured to store a measurement setting, a trigger line configured to transmit at least one trigger signal, and a control unit electrically connected to the trigger line and the memory unit. The control unit is configured to receive the trigger signal from the trigger line so as to instruct the spectrometer to perform a plurality of exposure measurements continuously under the measurement setting, and to save a plurality of spectral data acquired from the exposure measurements into the memory unit. A spectrometer using the electronic circuitry for performing the exposure measurements and a measuring method of the spectrometer are also provided.