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公开(公告)号：US11809933B2
公开(公告)日：2023-11-07
申请号：US17879279
申请日：2022-08-02
发明人： Nicolas B. Duarte , Zachary J. Brown , Juan F. Choreno , Julian M. Galvan-Miyoshi , Darin W. Laird , Alejandro Morones Dobarganes , Jose Alberto Olivares Lecona
CPC分类号： G06K19/0614 , B05D5/06 , B05D7/52 , G06K7/12
摘要： A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
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公开(公告)号：US12050950B2
公开(公告)日：2024-07-30
申请号：US18361725
申请日：2023-07-28
发明人： Nicolas B. Duarte , Zachary J. Brown , Juan F. Choreno , Julian M. Galvan-Miyoshi , Darin W. Laird , Alejandro Morones Dobarganes , Jose Alberto Olivares Lecona
CPC分类号： G06K19/0614 , B05D5/06 , B05D7/52 , G06K7/12
摘要： A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
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公开(公告)号：US11461607B2
公开(公告)日：2022-10-04
申请号：US17293813
申请日：2019-11-12
发明人： Nicolas B. Duarte , Zachary J. Brown , Juan F. Choreno , Julian M. Galvan-Miyoshi , Darin W. Laird , Alejandro Morones Dobarganes , Jose Alberto Olivares Lecona
摘要： A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
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公开(公告)号：US20220012555A1
公开(公告)日：2022-01-13
申请号：US17293813
申请日：2019-11-12
发明人： Nicolas B. Duarte , Zachary J. Brown , Juan F. Choreno , Julian M. Galvan-Miyoshi , Darin W. Laird , Alejandro Morones Dobarganes , Jose Alberto Olivares Lecona
摘要： A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
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公开(公告)号：US20230385586A1
公开(公告)日：2023-11-30
申请号：US18361725
申请日：2023-07-28
发明人： Nicolas B. Duarte , Zachary J. Brown , Juan F. Choreno , Julian M. Galvan-Miyoshi , Darin W. Laird , Alejandro Morones Dobarganes , Jose Alberto Olivares Lecona
CPC分类号： G06K19/0614 , G06K7/12 , B05D7/52 , B05D5/06
摘要： A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
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公开(公告)号：US20220374667A1
公开(公告)日：2022-11-24
申请号：US17879279
申请日：2022-08-02
发明人： Nicolas B. Duarte , Zachary J. Brown , Juan F. Choreno , Julian M. Galvan-Miyoshi , Darin W. Laird , Alejandro Morones Dobarganes , Jose Alberto Olivares Lecona
摘要： A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
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