Abstract:
A test system is capable of performing parallel modulation error measurement of transceivers using a loop-back configuration. Each transceiver includes a transmitter and a receiver. A signal generator generates a first modulated signal for input to the receivers of the transceivers. A tester is operable to measure a first demodulation error produced by the receiver in response to the first modulated signal and to measure a modulation error of the transmitter based on the first demodulation error and a second demodulation error. The second demodulation error is produced by the receiver in response to a second modulated signal generated by the transmitter and coupled from the transmitter to the receiver.
Abstract:
A multi-component production devices in accordance with a device design having performance specifications is made by a method comprising receiving respective component behavioral models of the production components constituting the production device; combining the component behavioral models in accordance with the device design to form a device behavioral model; and, prior to assembling the production device, and predicting performance metrics for the production device by performing simulated tests on the device behavioral model.