公开(公告)号：US09163936B1

公开(公告)日：2015-10-20

申请号：US13889203

申请日：2013-05-07

Applicant: Physical Optics Corporation

Inventor： Christopher Thad Ulmer ,  Paul Shnitser ,  David Harold Miller ,  Edward Matthew Patton ,  Paul Wilkinson

IPC: G01B11/24

CPC classification number: G01B11/2513 ,  G01B11/25

Abstract: Profilometers for industrial metrology and other applications are described. A line is projected on a surface to be profiled. The line is scanned to build a three dimensional point cloud allowing the three-dimensional (3D) profile of the surface to be determined. In some embodiments, the line is projected by a laser system. In other embodiments, the line is projected by a digital micromirror device (DMD). In still further embodiments, multiple lines, or other patterns are projected.

Abstract translation: 描述了工业测量和其他应用的轮廓仪。 将一条线投影在待刻划的表面上。 该线被扫描以构建三维点云，允许确定表面的三维（3D）轮廓。 在一些实施例中，线被激光系统投影。 在其他实施例中，线由数字微镜器件（DMD）投影。 在另外的实施例中，投影多条线或其他图案。