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公开(公告)号:US08784623B2
公开(公告)日:2014-07-22
申请号:US13003308
申请日:2009-02-17
IPC分类号: G01N27/327
CPC分类号: G01N33/48721
摘要: A nanopore device is described wherein is provided a sample input (110), an input chamber (120), and first and second sample chambers (130, 140) connected to the input chambers (120) via first and second nanopores (135, 145).
摘要翻译: 描述了纳米孔装置,其中提供了样品输入(110),输入室(120)以及通过第一和第二纳米孔(135,145)连接到输入室(120)的第一和第二样品室(130,140) )。
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公开(公告)号:US07042550B2
公开(公告)日:2006-05-09
申请号:US10716939
申请日:2003-11-20
申请人: Martin Lowisch , Marcel Mathijs Theodore Marie Dierichs , Koen Van Ingen Schenau , Hans Van Der Laan , Martinus Hendrikus Antonius Leenders , Elaine McCoo , Uwe Mickan
发明人: Martin Lowisch , Marcel Mathijs Theodore Marie Dierichs , Koen Van Ingen Schenau , Hans Van Der Laan , Martinus Hendrikus Antonius Leenders , Elaine McCoo , Uwe Mickan
CPC分类号: B82Y10/00 , B82Y40/00 , G03F1/24 , G03F7/70283 , G03F7/706
摘要: System aberrations are effected in a projection system of a lithographic apparatus to optimize imaging of a thick reflective mask with a thick absorber that is obliquely illuminated. The aberrations may include Z5 astigmatism, Z9 spherical, and Z12 astigmatism.
摘要翻译: 系统像差在光刻设备的投影系统中实现,以优化具有倾斜照明的厚吸收体的厚反射掩模的成像。 像差可能包括Z 5散光,Z 9球形和Z 12散光。
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