公开(公告)号：US20200342582A1

公开(公告)日：2020-10-29

申请号：US16318263

申请日：2017-08-07

Applicant: QD LASER, INC.

Inventor： Seiji MORINO ,  Makoto SUZUKI ,  Manabu ISHIMOTO

IPC: G06T7/00 ,  G06T7/60 ,  G06T3/00 ,  H04N9/31 ,  G02B27/01

Abstract: An image inspection device includes: a mounting unit on which an image projection device that directly projects an image on a retina of a user is to be mounted; a condensing lens configured to condense a light beam emitted from the image projection device mounted on the mounting unit; and a target projection unit on which an inspection image is to be projected by irradiation with the light beam condensed by the condensing lens; and an inspection unit configured to inspect the inspection image projected on the target projection unit.