公开(公告)号：US20140023128A1

公开(公告)日：2014-01-23

申请号：US13793994

申请日：2013-03-11

Applicant: QUALCOMM INCORPORATED

Inventor： Sudarsan Krishnan ,  David Coronel ,  Jay P. Shah

IPC: H04L25/03

CPC classification number: H04L25/03343 ,  H03F1/3241 ,  H03F1/3282 ,  H04B1/0475 ,  H04B2001/0425

Abstract: A method and apparatus for characterized pre-distortion calibration is provided. The method begins with the selection of a number of devices to be characterized. The number of devices selected may be a subset of a larger group of devices. The selected number of devices is then characterized. The method avoids characterizing the large group of devices. The calibration of the group of devices is then based on the characterization of the selected number of devices.

Abstract translation: 提供了用于表征预失真校准的方法和装置。 该方法从选择要表征的多个设备开始。 所选择的设备的数量可以是较大组设备的子集。 然后对选定数量的设备进行特征表征。 该方法避免了大量设备的表征。 然后，该组设备的校准基于所选择的设备数量的表征。

公开(公告)号：US09130796B2

公开(公告)日：2015-09-08

申请号：US13793994

申请日：2013-03-11

Applicant: QUALCOMM Incorporated

Inventor： Sudarsan Krishnan ,  David Coronel ,  Jay P. Shah

IPC: H04B3/46 ,  H04L25/49 ,  H04L25/03 ,  H03F1/32 ,  H04B1/04

CPC classification number: H04L25/03343 ,  H03F1/3241 ,  H03F1/3282 ,  H04B1/0475 ,  H04B2001/0425

Abstract: A method and apparatus for characterized pre-distortion calibration is provided. The method begins with the selection of a number of devices to be characterized. The number of devices selected may be a subset of a larger group of devices. The selected number of devices is then characterized. The method avoids characterizing the large group of devices. The calibration of the group of devices is then based on the characterization of the selected number of devices.

Abstract translation: 提供了用于表征预失真校准的方法和装置。 该方法从选择要表征的多个设备开始。 所选择的设备的数量可以是较大组设备的子集。 然后对选定数量的设备进行特征表征。 该方法避免了大量设备的表征。 然后，该组设备的校准基于所选择的设备数量的表征。