公开(公告)号：US20150035550A1

公开(公告)日：2015-02-05

申请号：US13959504

申请日：2013-08-05

Applicant: QUALCOMM INCORPORATED

Inventor： Rajkumar Chinnakonda Kubendran ,  Xinwei Wang ,  Xiandong Zhang

IPC: G01R27/26

CPC classification number: G01R27/2605 ,  G01K7/01 ,  G01K7/34 ,  G01R31/2856

Abstract: Techniques for measuring on-chip component parameters are described herein. In one embodiment, a method for measuring one or more on-chip component parameters comprises measuring a time for an on-chip capacitor to charge to a voltage approximately equal to a reference voltage, and measuring a time for the on-chip capacitor to charge to a voltage approximately equal to a voltage across an on-chip component. The method also comprises determining a parameter of the on-chip component based on the measured time for the on-chip capacitor to charge to the voltage approximately equal to the reference voltage, the measured time for the on-chip capacitor to charge to the voltage approximately equal to the voltage across the on-chip component, and the reference voltage.

Abstract translation: 本文描述了用于测量片上组件参数的技术。 在一个实施例中，用于测量一个或多个片上分量参数的方法包括测量片上电容器的时间以充电至大致等于参考电压的电压，并测量片上电容器充电的时间 达到大致等于片上组件的电压的电压。 该方法还包括基于片上电容器的测量时间来确定片上分量的参数，以将其充电到大约等于参考电压的电压，片上电容器的测量时间被充电到电压 大致等于片上部件上的电压和参考电压。