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公开(公告)号:US10559501B2
公开(公告)日:2020-02-11
申请号:US15271043
申请日:2016-09-20
发明人: Stanley Song , Jeffrey Xu , Da Yang , Kern Rim , Choh Fei Yeap
IPC分类号: H01L21/8238 , H01L27/092 , H01L29/10 , H01L29/66 , H01L21/3065
摘要: A method of producing a FinFET device with fin pitch of less than 20 nm is presented. In accordance with some embodiments, fins are deposited on sidewall spacers, which themselves are deposited on mandrels. The mandrels can be formed by lithographic processes while the fins and sidewall spacers formed by deposition technologies.