公开(公告)号：US20240086445A1

公开(公告)日：2024-03-14

申请号：US18340771

申请日：2023-06-23

Applicant: QUALCOMM Incorporated

Inventor： Murat CAKIR ,  Lindsey Makana KOSTAS ,  Narasimhan NARAYANAN ,  Jonathan Charles BRAUER ,  Michael Robert MANAHAN ,  Ruitao DOU ,  Yanjia CHEN ,  Pradeep Mohanan NAIR

IPC: G06F16/35 ,  G06F16/38

CPC classification number: G06F16/35 ,  G06F16/38

Abstract: A method for processor-implemented method includes receiving an integrated circuit (IC) troubleshooting query for an IC. The IC troubleshooting query is received from a user. The method also includes performing natural language processing and machine learning to cluster the IC troubleshooting query into one of a number of semantically similar troubleshooting categories. The method further includes retrieving resolution data from an expert system library, based on a mapping between categories of user solutions and a topic of the IC troubleshooting query. The method also includes generating a recommendation in response to the IC troubleshooting query, based on the resolution data. The method outputs the recommendation to the user.

公开(公告)号：US20240427683A1

公开(公告)日：2024-12-26

申请号：US18340004

申请日：2023-06-22

Applicant: QUALCOMM Incorporated

Inventor： Mustafa KESKIN ,  Murat CAKIR ,  Lindsey Makana KOSTAS

IPC: G06F11/30 ,  G06F11/07

Abstract: This disclosure provides methods, devices, and systems for troubleshooting operation of an electronic device, the method comprising by receiving performance data from a plurality of electrical components, and including a portion of the performance data within a dynamic time window. The portion includes event data. The dynamic time window may be manipulated to include dependent event data within the portion. The dependent event data shares an interdependency with the event data. Troubleshooting analysis determined from the interdependency may be output.