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公开(公告)号：US12181495B2
公开(公告)日：2024-12-31
申请号：US18061502
申请日：2022-12-05
Applicant: Quanta Computer Inc.
Inventor： Wei-Chih Hung , Ying-Ping Chiang , Yu-Ren Ruan , Chia-Hao Wu
Abstract: A test device includes a power compensation module and a test module. The power compensation module receives AC power generated by a device under test to generate DC power to the device under test. The test module provides a plurality of test signals and a test mode to the device under test for testing the device under test.
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