公开(公告)号：US12163897B2

公开(公告)日：2024-12-10

申请号：US17702610

申请日：2022-03-23

Applicant: RAYTHEON TECHNOLOGIES CORPORATION

Inventor： Nigel David Sawyers-Abbott ,  Ron I. Prihar ,  Garrett Kernozicky ,  Zhong Ouyang

IPC: G01N21/95 ,  G01B5/008 ,  G01N21/91 ,  G05B19/418 ,  F01D5/14

Abstract: An article of manufacture may include a tangible, non-transitory computer-readable storage medium having instructions stored thereon that, in response to execution by a processor, cause the processor to perform operations comprising: commanding, via the processor, a first scan of a bladed rotor; generating, via the processor, a three-dimensional model based on a first set of data received from a first scanner; comparing, via the processor, the three-dimensional model to an acceptable three-dimensional model of the bladed rotor; determining, via the processor, areas of interest based on the comparison; and commanding, via the processor, a contact probe to perform a non-destructive inspection on the areas of interest.

公开(公告)号：US11668773B2

公开(公告)日：2023-06-06

申请号：US16948029

申请日：2020-08-27

Applicant: Raytheon Technologies Corporation

Inventor： Andrew DeBiccari ,  Zhong Ouyang

IPC: G01R33/12 ,  G01N27/87 ,  G01M15/14

CPC classification number: G01R33/1223 ,  G01M15/14 ,  G01N27/87

Abstract: A system for magnetically inspecting a metallic component uses a manipulator configured to manipulate a relative position between a part fixture that holds the metallic component and a probe fixture that holds a magnetic probe, thereby causing the probe tip to trace an inspection route along the surface of the metallic component so that the probe tip contacts the metallic component such that an angular difference between the probe axis and a vector normal to the surface is less than a predetermined angle delta. The magnetic probe has a probe tip that measures magnetic permeability of the metallic component along the inspection route, which the controller receives. A method of performing the magnetic inspection is also disclosed.

公开(公告)号：US12216184B2

公开(公告)日：2025-02-04

申请号：US18310937

申请日：2023-05-02

Applicant: Raytheon Technologies Corporation

Inventor： Andrew DeBiccari ,  Zhong Ouyang

IPC: G01R33/12 ,  G01M15/14 ,  G01N27/87

Abstract: A system for magnetically inspecting a metallic component uses a manipulator configured to manipulate a relative position between a part fixture that holds the metallic component and a probe fixture that holds a magnetic probe, thereby causing the probe tip to trace an inspection route along the surface of the metallic component so that the probe tip contacts the metallic component such that an angular difference between the probe axis and a vector normal to the surface is less than a predetermined angle delta. The magnetic probe has a probe tip that measures magnetic permeability of the metallic component along the inspection route, which the controller receives. A method of performing the magnetic inspection is also disclosed.

公开(公告)号：US12209997B2

公开(公告)日：2025-01-28

申请号：US17730114

申请日：2022-04-26

Applicant: RAYTHEON TECHNOLOGIES CORPORATION

Inventor： Derek J. Michaels ,  Elizabeth F. Vinson ,  Zhong Ouyang

IPC: G01N29/34 ,  G06T7/00

Abstract: An inspection device is disclosed herein. The inspection device may comprise: a support structure; a motor; a shaft operably coupled to the motor, the shaft extending from a first side of the support structure to a second side of the support structure, the shaft configured to couple to a bladed rotor; an optical device moveably coupled to the support structure; and a broad-band energy source configured to generate acoustic energy through the bladed rotor during inspection.

公开(公告)号：US20230273277A1

公开(公告)日：2023-08-31

申请号：US18310937

申请日：2023-05-02

Applicant: Raytheon Technologies Corporation

Inventor： Andrew DeBiccari ,  Zhong Ouyang

IPC: G01R33/12 ,  G01N27/87 ,  G01M15/14

CPC classification number: G01R33/1223 ,  G01N27/87 ,  G01M15/14

Abstract: A system for magnetically inspecting a metallic component uses a manipulator configured to manipulate a relative position between a part fixture that holds the metallic component and a probe fixture that holds a magnetic probe, thereby causing the probe tip to trace an inspection route along the surface of the metallic component so that the probe tip contacts the metallic component such that an angular difference between the probe axis and a vector normal to the surface is less than a predetermined angle delta. The magnetic probe has a probe tip that measures magnetic permeability of the metallic component along the inspection route, which the controller receives. A method of performing the magnetic inspection is also disclosed.