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公开(公告)号:US20250027890A1
公开(公告)日:2025-01-23
申请号:US18712873
申请日:2022-10-25
Applicant: RIKEN
Inventor: Kunihiro FUJITA , Takaoki TAKANASHI , Chihiro IWAMOTO , Yoshie OTAKE
IPC: G01N23/05
Abstract: An observation device includes a neutron emission device, a detection device, and a data processing device. The neutron emission device emits neutrons to an inspection object. The detection device detects exit neutrons from the inspection object at one set of detection positions in a peripheral direction around the inspection object, outside the inspection object, and measures the number of the detected exit neutrons for each of the detection positions. The data processing device generates reconstructed cross-sectional data by performing reconstruction processing based on the number of the detected exit neutrons at each of the one set of detection positions. The reconstructed cross-sectional data represent a two-dimensional distribution of a neutron reaction rate in an imaginary cross-section of the inspection object.
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公开(公告)号:US20230393082A1
公开(公告)日:2023-12-07
申请号:US18031745
申请日:2021-10-15
Applicant: RIKEN
Inventor: Kunihiro FUJITA , Chihiro IWAMOTO , Takaoki TAKANASHI , Yoshie OTAKE
IPC: G01N23/20008
CPC classification number: G01N23/20008 , G01N2223/316
Abstract: A nondestructive inspecting device (10) includes a neutron emission device (2) that emits a neutron beam to a local irradiation location on a surface (la) of an inspection target (1), a detection device (3) that detects, at each of inspection positions facing the surface (la), scattered neutrons returned from the inspection target (1) as a result of emission of the neutron beam to the irradiation location, and measures the detected number of the scattered neutrons at each of the detection positions, and a ratio calculation unit (5) that calculates, for each of the detection positions, a ratio of the detected number at the detection position to a reference value for the detection position, and outputs the ratios. The reference value is set as the detected number at each of the detection positions in an assumed case of no defects existing in the inspection target (1).
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