摘要:
A reference height calibration procedure obtains a reference error value, which can be used to adjust a height calibration parameter for registering the fields of view (FOVs) of the modules of a multi-modality medical imaging system such as a SPECT-CT imaging system.
摘要:
A reference height calibration procedure obtains a reference error value, which can be used to adjust a height calibration parameter for registering the fields of view (FOVs) of the modules of a multi-modality medical imaging system such as a SPECT-CT imaging system.
摘要:
A root cause associated with an anomalous event in a device is determined. A method includes retrieving one or more event records associated with the device from a database. The method further includes determining a risk category associated with the one or more event records based on information present in the one or more event records. The risk category indicates a risk associated with a functioning of the device. Additionally, the method includes determining a priority associated with each of the one or more event records based on a baseline associated with the one or more event records. The baseline is defined based on a set of events that occur during a normal functioning of the device. The method includes determining the root cause associated with the anomalous event in the device based on the risk category and the priority associated with the event records.
摘要:
A method to achieve perceived reliability for repairable systems including goal setting of different phases of the product life cycle. The method includes consideration of a plurality of product life cycle phases to determine a plurality of failure rate multipliers which are transformed to mean time between failures multipliers and normalized. Using these computed mean times between failures multipliers and a chosen level of customer use, the box-of-parts required mean time between failures level can be calculated. Also, the required mean time between failures for design, manufacturing, infant mortality, and service phase of product life cycle can be computed.