公开(公告)号：US20090144595A1

公开(公告)日：2009-06-04

申请号：US12023825

申请日：2008-01-31

申请人： Richard D. Reohr, JR. ,  Matthew F. Barr ,  Richard David Wiita

发明人： Richard D. Reohr, JR. ,  Matthew F. Barr ,  Richard David Wiita

IPC分类号： G01R31/3187 ,  G06F11/26 ,  G06F11/27

CPC分类号： G06F11/27 ,  G01R31/318519 ,  G01R31/3187

摘要： A field programmable object array integrated circuit has built-in self-testing capability. The integrated circuit comprises an array of programmable objects, a plurality of interfaces, and a controller. The array of objects is designed to operate at an operational clock speed during non-testing operation, wherein the design of the objects is not constrained to require within an object extra circuitry not essential to non-testing operation to facilitate built-in self-testing. The interfaces are connected to the objects to enable communication with the objects and to thereby facilitate built-in self-testing of the objects. The controller causes a selected subset of the objects to be activated and configured for testing, to stimulate the selected subset for some time with an input test pattern delivered via the interfaces while the selected subset of objects operates at the operational clock speed, and to observe a response of the selected subset of objects.

摘要翻译： 现场可编程对象阵列集成电路具有内置的自检功能。 集成电路包括可编程对象阵列，多个接口和控制器。 对象阵列被设计为在非测试操作期间以操作时钟速度操作，其中对象的设计不被限制为在物体内需要额外的电路，而不是非测试操作所必需的，以便于内置的自检 。 这些接口连接到对象，以实现与对象的通信，从而促进对象的内置自检。 控制器使得被选择的对象子集被激活并被配置用于测试，以通过接口递送的输入测试模式来刺激所选择的子集，同时所选择的对象子集以操作时钟速度操作，并观察 所选择的对象子集的响应。