公开(公告)号：US20040011974A1

公开(公告)日：2004-01-22

申请号：US10057779

申请日：2002-01-24

Applicant: Rion Co., Ltd.

Inventor： Tomonobu Matsuda ,  Takashi Minakami ,  Kenji Sasaki ,  Tsutomu Nakajima

IPC: G01N015/06 ,  G01N021/49 ,  G01N021/85

CPC classification number: G01N15/1436 ,  G01N21/53

Abstract: According to the present invention, there is provided a light scattering type particle detector, using a semiconductor laser as a light source, for detecting particles contained in sample fluid which defines a flow path, wherein laser light generated from the semiconductor laser is irradiated to irradiate a region of the flow path with a concave mirror and thereby a particle detecting region is defined. According to the present invention, there is also provided a laser oscillator wherein the optical axis of a semiconductor laser for generating pumping laser light has a predetermined angle with respect to the optical axis of a laser medium for irradiating laser light by pumping. Using such a laser oscillator, laser light irradiated from the laser oscillator is condensed to irradiate a region of a flow path defined by sample fluid, and thereby a particle detecting region is defined. Particles contained in the particle detecting region are detected by receiving scattered light with a light receiving portion.

Abstract translation: 根据本发明，提供了一种使用半导体激光器作为光源的光散射型粒子检测器，用于检测限定流路的样品流体中包含的颗粒，其中照射从半导体激光器产生的激光以照射 定义具有凹面镜的流路的区域，从而确定粒子检测区域。 根据本发明，还提供了一种激光振荡器，其中用于产生泵浦激光的半导体激光器的光轴相对于用于通过泵浦照射激光的激光介质的光轴具有预定的角度。 使用这样的激光振荡器，从激光振荡器照射的激光被冷凝，照射由样品流体限定的流路的区域，从而定义了粒子检测区域。 通过用光接收部接收散射光来检测包含在粒子检测区域中的粒子。