Magnetic-field-measuring probe
    1.
    发明授权
    Magnetic-field-measuring probe 失效
    磁场测量探头

    公开(公告)号:US07411391B2

    公开(公告)日:2008-08-12

    申请号:US10575234

    申请日:2004-10-08

    IPC分类号: G01R33/02 G01R33/06

    CPC分类号: G01R33/02

    摘要: A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors (14, 16) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.

    摘要翻译: 磁场测量探头包括至少一个沿特权测量轴对磁场敏感的磁阻或磁感应传感器。 该探针包括:至少两个磁阻或磁感应传感器(14,16),其彼此刚性地连接,使得它们的特权测量轴线在横向于该方向的方向上彼此平行和偏移 特权测量轴; 以及特定于每个磁阻或磁感应传感器的输出端子,以便提供表示由每个传感器沿其特权测量轴测量的磁场的信号。

    Method and installation for analyzing an integrated circuit
    2.
    发明授权
    Method and installation for analyzing an integrated circuit 失效
    分析集成电路的方法和安装

    公开(公告)号:US07560940B2

    公开(公告)日:2009-07-14

    申请号:US11664120

    申请日:2005-09-30

    CPC分类号: G01R31/311

    摘要: A method and installation for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, the following steps: applying a laser radiation, in one point of the surface of the integrated circuit; exciting the circuit; collecting the response of the circuit to the excitation; calculating the propagation time intervening between the excitation time and the response-collecting time; and creating an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application.

    摘要翻译: 一种用于分析集成电路的方法和装置。 该方法包括对于集成电路的多个表面点,以下步骤:在集成电路的表面的一个点处施加激光辐射; 激励电路; 收集电路对激励的响应; 计算介于激发时间和响应采集时间之间的传播时间; 以及创建集成电路的图像,其显示表示在激光辐射应用的每个点处的传播时间的值。