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公开(公告)号：US11201009B2
公开(公告)日：2021-12-14
申请号：US16149124
申请日：2018-10-01
发明人： Kyoung Jin Cha , Seung Heui Lee , Hyun Soo Oh , Hyung Soon Kwon , Ji Hong Jo
摘要： A method of manufacturing a multilayer ceramic electronic component includes preparing a ceramic green sheet containing a ceramic powder and forming an internal electrode pattern on the ceramic green sheet using a conductive paste containing conductive metal particles and an additive. A ceramic laminate is formed by stacking the ceramic green sheets on which the internal electrode pattern is formed. A ceramic body including dielectric layers and internal electrodes is formed by sintering the ceramic laminate. An average number of conductive metal particles in the internal electrode pattern in a thickness direction is more than 2 and 5 or less.
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公开(公告)号：US11569034B2
公开(公告)日：2023-01-31
申请号：US17464150
申请日：2021-09-01
发明人： Kyoung Jin Cha , Hyun Soo Oh , Woo Chul Shin , Hye Ji Jang
摘要： A multilayer ceramic electronic component includes a ceramic body including first and second internal electrodes disposed to face each other and a dielectric layer interposed therebetween. When an average thickness of the dielectric layer is denoted as ‘td,’ an average thickness of the first and second internal electrodes is denoted as ‘te,’ and a standard deviation of thicknesses of an internal electrode, measured at a plurality of points in a predetermined region of the internal electrode, is denoted as ‘σte,’ a ratio of the standard deviation of thicknesses of the internal electrode to the average thickness of the dielectric layer, which is denoted as ‘σte/td,’ satisfies 0.12≤σte/td≤0.21.
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公开(公告)号：US11158458B2
公开(公告)日：2021-10-26
申请号：US16680995
申请日：2019-11-12
发明人： Kyoung Jin Cha , Hyun Soo Oh , Woo Chul Shin , Hye Ji Jang
摘要： A multilayer ceramic electronic component includes a ceramic body including first and second internal electrodes disposed to face each other and a dielectric layer interposed therebetween. When an average thickness of the dielectric layer is denoted as ‘td,’ an average thickness of the first and second internal electrodes is denoted as ‘te,’ and a standard deviation of thicknesses of an internal electrode, measured at a plurality of points in a predetermined region of the internal electrode, is denoted as ‘σte,’ a ratio of the standard deviation of thicknesses of the internal electrode to the average thickness of the dielectric layer, which is denoted as ‘σte/td,’ satisfies 0.12≤σte/td≤0.21.
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