公开(公告)号：US12235713B2

公开(公告)日：2025-02-25

申请号：US17376441

申请日：2021-07-15

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Young-Seop Shim ,  Kyung Duk Lee ,  Jong-Sung Na ,  Chan Moo Park ,  In Kap Chang ,  Chang Min Cho

IPC: G06F11/00 ,  G06F17/18 ,  G06N20/00

Abstract: A method for operating a storage device capable of improving reliability of a memory system is provided. The method includes providing a storage device which includes a first component and a second component; receiving, via a host interface of the storage device, a command for requesting failure possibility information about the storage device from an external device; and providing, via the host interface, the failure possibility information about the storage device to the external device in response to the command.