公开(公告)号：US11581964B2

公开(公告)日：2023-02-14

申请号：US17185498

申请日：2021-02-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hongmin Choi ,  Haedong Yeon ,  Junse Lee ,  Heesang Noh ,  Changhyun Baek

IPC: H04B17/364 ,  H04B17/354 ,  H04B17/13

Abstract: A method is provided. The method includes estimating adjacent channel leakage ratios respectively corresponding based on a test output signal output from a power amplifier according to a test input signal corresponding to a plurality of frequencies; selecting a test delay value corresponding to a largest value among the estimated adjacent channel leakage ratios; and providing a supply voltage to the power amplifier based on an envelope signal delayed according to the selected test delay value. For each of the plurality of test delay values, a corresponding adjacent channel leakage ratio is estimated based on a ratio of a magnitude of a component included in the test output signal and a magnitude of an inter-modulated component.

公开(公告)号：US20220014287A1

公开(公告)日：2022-01-13

申请号：US17185498

申请日：2021-02-25

Applicant: SAMSUNG ELECTRONICS CO., LTD

Inventor： Hongmin Choi ,  Haedong Yeon ,  Junse Lee ,  Heesang Noh ,  Changhyun Baek

IPC: H04B17/364 ,  H04B17/354 ,  H04B17/13

Abstract: A method is provided. The method includes estimating adjacent channel leakage ratios respectively corresponding based on a test output signal output from a power amplifier according to a test input signal corresponding to a plurality of frequencies; selecting a test delay value corresponding to a largest value among the estimated adjacent channel leakage ratios; and providing a supply voltage to the power amplifier based on an envelope signal delayed according to the selected test delay value. For each of the plurality of test delay values, a corresponding adjacent channel leakage ratio is estimated based on a ratio of a magnitude of a component included in the test output signal and a magnitude of an inter-modulated component.